Abstract Cadmium oxide CdO thin films were deposited by thermal evaporation technique at different substrate temperatures on glass substrates. The XRD analysis shows that CdO films are amorphous and transform to polycrystalline with cubic structure when deposited at 448K and annealed at 573K. The direct energy band gap of CdO thin film decreases with increases of substrate temperature, while at an annealing temperature of 573K the energy gap increases. The results were explained on the biases of structural disordered intruding by the effect of Ts. Other optical constants, such as refractive index, extinction coefficient, dielectric constant were also studied. The response of the films to sense H2 gas has been investigated and they exhibited a maximum sensitivity of 6%. The response time to immediate injection and removal of a certain amount of gas were measured.
"Characterization and gas sensitivity of cadmium oxide thin films prepared by thermal evaporation technique,"
International Journal of Thin Film Science and Technology: Vol. 1
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Available at: https://digitalcommons.aaru.edu.jo/ijtfst/vol1/iss1/1