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International Journal of Thin Film Science and Technology

International Journal of Thin Film Science and Technology

Abstract

Capacitive density of microcapacitors can be modulated with nanostructured materials via the Coulomb Blockade Effect (CBE). In recent years, the dielectric properties (k and D) of multifarious nanostructured materials have been investigated for application as dielectric material in embedded capacitors. Here we demonstrate that the capacitive response of Ag/PVA nanocomposites on account Coulomb Blockade Effect of nanostructured Ag particles is significant in comparisons to their bulk counterpart and the matrix. The findings regarding the variation of dielectric character on concentration of AgNO3 and the circuit application of the fabricated capacitors are some important ingredients of this investigation.

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