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International Journal of Thin Film Science and Technology

International Journal of Thin Film Science and Technology

Authors

Fadoua Mansouri, Laboratory of Materials Physics and Subatomic, Faculty of Science, University Ibn Tofail, BP.133-14000 Kénitra, MoroccoFollow
Yassine Khaaissa, Laboratory of Materials Physics and Subatomic, Faculty of Science, University Ibn Tofail, BP.133-14000 Kénitra, MoroccoFollow
Abdelali Talbi, Laboratory of Materials Physics and Subatomic, Faculty of Science, University Ibn Tofail, BP.133-14000 Kénitra, MoroccoFollow
Khalid Nouneh, Laboratory of Materials Physics and Subatomic, Faculty of Science, University Ibn Tofail, BP.133-14000 Kénitra, MoroccoFollow
Outman El Khouja, Laboratory of Materials Physics and Subatomic, Faculty of Science, University Ibn Tofail, BP.133-14000 Kénitra, Morocco\\ Laboratory of Multifunctional Materials and Structures, National Institute of Materials Physics, Atomistilor 405A, 077125 Magurele, RomaniaFollow
Hassan Ahmoum, Key Laboratory of Electromagnetic Processing of Materials (Ministry of Education), Northeastern University, Shenyang, 110819, China\\ Physics of Materials and Systems Modeling Laboratory (PMSML), Unit Associated at CNRST-URAC: 08, Faculty of Sciences, Moulay Ismail University, B.P, 11201, Zitoune, Meknes, MoroccoFollow
Aurelian Catalin Galca, Laboratory of Multifunctional Materials and Structures, National Institute of Materials Physics, Atomistilor 405A, 077125 Magurele, RomaniaFollow
Guojian Li, Key Laboratory of Electromagnetic Processing of Materials (Ministry of Education), Northeastern University, Shenyang, 110819, ChinaFollow
Qiang Wang, Key Laboratory of Electromagnetic Processing of Materials (Ministry of Education), Northeastern University, Shenyang, 110819, ChinaFollow
Omar Bajjou, Physics department, Faculty of Sciences and Technics, Sultan Moulay Slimane University, Beni Mellal, MoroccoFollow
Mustapha Mabrouki, Physics department, Faculty of Sciences and Technics, Sultan Moulay Slimane University, Beni Mellal, MoroccoFollow

Abstract

This paper manifests the synthesis and characterization of zinc sulfur (ZnS) thin films combined with numerical simulation (SCAPS-1D). The synthesis has been done by mixing and depositing Zn and S precursors on a preheated glass substrate (450 °C) with different molar concentrations. X-ray diffraction (XRD) shows the formation of polycrystalline ZnS with a mixed hexagonal/cubic structure. Raman spectroscopy analysis validates the films purity with a predominant peak at 348 cm-1 corresponding to the cubic structure. Composition elements and atomic ratio have been confirmed by the energy dispersive X-ray analysis (EDX). Scanning electronic microscopy (SEM) and atomic force microscopy (AFM) images show uniform and well-arranged spherical grains on the samples surface with a non-neglected roughness variation. The optical results show high transparency in the visual field of light (≃80%) and a sharp absorption edge in the UV domain. The optical band gap has been considerably decreased with increasing the concentrations reflecting its high dependency on the molarity rate. Numerical modeling results using SCAPS-1D software show that samples corresponding to 0.06 and 0.08 molarity present better performance with an efficiency of 8.94% and 8.9%, respectively.

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