Zinc selenide thick films were prepared by evaporation technique onto glass substrates. The nature of the films was investigated by XRD pattern. The optical properties of the as-deposited and UV-irradiated films with different exposure times (0, 30, 60, 90, and 120 min.) were reported. The polycrystalline nature of the films was detected by XRD measurements. XRD patterns for UV irradiated films show that the intensities of the peaks increase with increasing the UV-irradiated time, but the full width at half maximum (FWHM) decreases. The optical constants of the films were calculated by Swanepoels method in terms of wedge shape model in order to obtain both thickness and refractive index with high precision. The energy gap of ZnSe films were determined by using the transmission in terms of transmission spectra in the strong absorption region. In terms of the obtained results, the increase of exposure time improved shrinkage of non-uniform transmission in both the medium and robust absorption region of the ZnSe film. The optimal improvement was at UV-irradiation time equal 120 min. Owing to tunability in the optical constant and energy gap of ZnSe thin films with UV-irradiation ZnSe serves as promising films in optoelectronic devices. Also, The dielectric constant and dissipation factor of ZnSe films and found to be decreased with increasing of the exposure time of UV-irradiation.
H. Abdeljalil, M.; El-Taher, A; and R. Shaaban, E.
"Applying Optical Swanepoels Model to Assess the Effect of UV-Irradiated Time on Optical Properties of ZnSe Thick Film,"
International Journal of Thin Film Science and Technology: Vol. 10
, Article 2.
Available at: https://digitalcommons.aaru.edu.jo/ijtfst/vol10/iss3/2