ZnO Thin films were deposited on glass substrates at 350 ± 10 0C by pyrolysis spray technique. A very thin layer of SnO2 was deposited under ZnO films for the purpose of getting a bilayer thin SnO2/ ZnO. A thermal annealing was carried out for the bilayer with a temperature of 350 0C for one hour. The structural, optical and electrical properties of monolayer ZnO films and SnO2/ZnO bilayer thin films were investigated. X-ray diffraction confirmed the hexagonal wurtzite structure of ZnO films, and the hexagonal tetragonal structure of SnO2/ZnO bilayer films. The optical measurement showed a rise of the average transmittance from 81 % to 94 % for SnO2/ZnO annealed bilayer films. The optical band gap varied between 3.22 to 3.31 eV for SnO2/ZnO annealed bilayer films. The maximum electrical conductivity of 17.85 (Ω .cm-1) has been observed for SnO2/ZnO annealed bilayer films.
Salim, K. and N. Amroun, M.
"Improved Physical Properties of ZnO Films with a second Superposed SnO2 very Thin Films Deposited by Spray Pyrolysis Method,"
International Journal of Thin Film Science and Technology: Vol. 11
, PP -.
Available at: https://digitalcommons.aaru.edu.jo/ijtfst/vol11/iss1/4