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International Journal of Thin Film Science and Technology

International Journal of Thin Film Science and Technology

Abstract

Three thin films were Fabricated of polymers poly formyl pyrrole, poly furfural and poly formyl thiophene and characterized by UV-Vis spectrophotometer and AFM. The films at 450 nm thickness required times 6, 20, 55 h for polymers PFPy, PFFu and PFTh respectively. In UV-Vis spectrum, the absorption coefficient of the maximum peak for polymers solutions and the films was determined. In the case of the film, the constant was smaller than it should be by a large difference due to light scattering in the solid state. In the atomic force microscope images, the PFPy thin film was the most roughness and particle size 154nm while the PFFu film had the average roughness and particle size 87nm while, the less rough one was PFTh film with particle size 36 nm.

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