The dielectric permittivity ε and AC conductivity σA.C of CuInSSe, thin films were measured at temperatures in the range( 303- 453 K) and frequencies in the range 100 Hz to 10 MHz. The A.C activation energy estimated from Arrhenius equation 0.1553eV for CuInSSe, and thin films which increases with substrate temperature and decrease with increase of frequency. The exponent s shows anon systematic sequence with Ts for CuInSSe thin films. The results explain in terms of structural difference by the effect of Ts and thermal treatment.
A. Hasan, Bushra
"AC Conductivity and dielectric analysis of CuInSSe Thin Films,"
International Journal of Thin Film Science and Technology: Vol. 2
, Article 5.
Available at: https://digitalcommons.aaru.edu.jo/ijtfst/vol2/iss1/5