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International Journal of Thin Film Science and Technology

International Journal of Thin Film Science and Technology

Abstract

Thin films of CuS were prepared by Successive Ionic Layer And Reaction (SILAR) method from solution of CuCl2 and Na2S at two different molarities (0.03 M and 0.06 M) on glass substrates at room temperature. The structural and optical properties of CuS films were determined using X-ray diffraction (XRD) and UV-VIS spectrophotometer respectively. The films are polycrystalline, very adherent to the substrate and well crystallized according to the centered cubic structure with preferential orientation along (103) . It was found that the energy gap of CuS varies from 2.4eV to 2.8eV for thickness of 0.55μm and 0.82μm respectively (i.e depending on the deposition conditions).

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