International Journal of Thin Film Science and Technology
Abstract
Thin films of PbSe are prepared by vacuum deposition technique on to well cleaned glass substrates. Thin film capacitors of the type (Al-PbSe-Al) have been fabricated. AC Conduction and Dielectric studies performed on samples of thickness 300,500 and 700nm at various frequencies (10kHz-10MHz) and temperatures (293K-493K).From the AC conduction studies, it is confirmed that the mechanism responsible for the conduction process is hopping. Thermal activation energy is found to decrease with increase in film thickness. The variations of the dielectric constant and loss as function of frequency at different thicknesses and temperatures are observed and the results are discussed. The polarizability α is found to decrease with the increase of thickness while it increases with temperature.
Recommended Citation
Bushra A., Hasan
(2014)
"AC Conduction and Dielectric Characterization of Vacuum Evaporated PbSe thin Films,"
International Journal of Thin Film Science and Technology: Vol. 3
:
Iss.
2
, PP -.
Available at:
https://digitalcommons.aaru.edu.jo/ijtfst/vol3/iss2/8