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International Journal of Thin Film Science and Technology

International Journal of Thin Film Science and Technology

Abstract

In the present study, semiconducting glasses with composition xBi2O3-(20-x)Li2O-20V2O5-60B2O3 (0 ≤ x ≤ 15) mol % have been prepared by the conventional melt quenching technique. The glassy state of the as prepared samples is characterized using X-ray diffraction (XRD). The density and molar volume of the investigated glass system increase with increasing Bi2O3 content. The infrared spectra of these glasses are recorded over a continuous spectral range (400-4000 cm1) as an attempt to study their structure systematically. FT-IR spectroscopy data reveal that B2O3 and Bi2O3 behave as network formers and incorporated in the vitreous network as [BO3], [BO4], [BiO3], [BiO6], also V2O5 incorporated in the vitreous network as [VO4] and [VO5] structural units. Also it is found that the number of non-bridging oxygen ions (NBOIs) increases with increasing Bi2O3 content. The measured DC conductivity, σdc, increases and the activation energy decreases at low temperature region at the same time the conductivity at high temperature region decreases and the activation energy increases with increasing Bi2O3 content. DC conductivity at room temperature (303 K) is typically 10-710-6 (Ω-1m-1) with activation energies at low and high temperature regions 0.34-0.17 (eV) and 0.80-0.64 (eV) respectively. Debye temperature, θD, increases with increasing Bi2O3 content with typical values 768-860 K.

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