Models, Methods and Measurements of Thin Films Resistivities of Ni/Cu Bi layers and Ni/Pd/Cu Tri layers Films.

Authors

M. K. Loudjani, Université Paris-Saclay, Institut de Chimie Moléculaire et des Matériaux dOrsay (ICMMO), UMR 8182 (CNRS), Equipe Synthèse, Propriétés et Modélisation des Matériaux (SP2M), Bât 410, Bur. 350, Rue du Doyen Georges Poitou 91405 Orsay Cedex, France.Follow
C. Sella, Institut des Nano-Sciences de Paris, Université de Paris-VI, campus Boucicaut, 140 rue de Lourmel 75015 Paris, France.Follow

Abstract

In this study we compared resistivity measurements I and film thicknesses obtained on bi layers Ni/Cu films and tri layers Ni/Pd/Cu films with the values of resistivities and thicknesses calculated according to the model of Schumann and Gardner applied to a multi-layera system. The experimental and calculated values agree within a few %.

Recommended Citation

K. Loudjani, M. and Sella, C. (2018) "Models, Methods and Measurements of Thin Films Resistivities of Ni/Cu Bi layers and Ni/Pd/Cu Tri layers Films.," International Journal of Thin Film Science and Technology: Vol. 7 : Iss. 2 , PP -.
Available at: https://digitalcommons.aaru.edu.jo/ijtfst/vol7/iss2/3