In this study we compared resistivity measurements I and film thicknesses obtained on bi layers Ni/Cu films and tri layers Ni/Pd/Cu films with the values of resistivities and thicknesses calculated according to the model of Schumann and Gardner applied to a multi-layera system. The experimental and calculated values agree within a few %.
K. Loudjani, M. and Sella, C.
"Models, Methods and Measurements of Thin Films Resistivities of Ni/Cu Bi layers and Ni/Pd/Cu Tri layers Films.,"
International Journal of Thin Film Science and Technology: Vol. 7
, Article 3.
Available at: https://digitalcommons.aaru.edu.jo/ijtfst/vol7/iss2/3