In this work, we demonstrate the preparation of simple and inexpensive spray route for the preparation of pure and W doped NiO thin films on the quartz glass plates. The microstructure and morphological properties were investigated using an X-ray diffraction and Scanning electron microscopic (SEM) studies. SEM images notify the presence of hollow sphere and the energy dispersive spectrum confirms the existence of both Ni and W in the prepared films. Electrical properties were investigated by two probe conductivity studies. In addition to these studies (n-Si/NiO/Au and n- Si/W:NiO/Au) diodes were fabricated and their chattels were deliberated.
Joseph, Saju and N. Balasundaram, O.
"Effect of W Doping on NiO Thin Films and its Optical, Morphological and Diode Characteristics,"
International Journal of Thin Film Science and Technology: Vol. 8
, Article 5.
Available at: https://digitalcommons.aaru.edu.jo/ijtfst/vol8/iss3/5