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International Journal of Thin Film Science and Technology

International Journal of Thin Film Science and Technology

Abstract

Thin films of ZnO, SnO2 and CdO have been deposited using spray pyrolysis technique. They were characterized by X-Ray diffraction (XRD), optical absorption in the wavelength range 200-2500 nm and Hall Effect measurements. A comparative study was conducted for the prepared TCO’s thin films. The structural studies revealed the formation of polycrystalline thin films with a hexagonal wurtzite and tetragonal rutile structure for ZnO and SnO2 thin films respectively, whereas a cubic structure was found for the CdO films. Optical studies showed that the prepared SnO2, ZnO and CdO thin films had a direct band gap of 3.72, 2.98 and 2.43 eV, respectively. The ZnO films exhibited highest optical transmittance that varied between 70% - 88%. The film thickness of the samples was estimated from transmission spectra. The effective mass of the carriers (m*) at the Fermi level and the figure of merit of the deposited films are also investigated. Hall Effect measurements confirm the n-type nature of the TCO’s thin films. A low resistivity in the order of 10-2 (Ω.cm) has been observed for SnO2 and CdO thin films.

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