Thin films of ZnO, SnO2 and CdO have been deposited using spray pyrolysis technique. They were characterized by X-Ray diffraction (XRD), optical absorption in the wavelength range 200-2500 nm and Hall Effect measurements. A comparative study was conducted for the prepared TCO’s thin films. The structural studies revealed the formation of polycrystalline thin films with a hexagonal wurtzite and tetragonal rutile structure for ZnO and SnO2 thin films respectively, whereas a cubic structure was found for the CdO films. Optical studies showed that the prepared SnO2, ZnO and CdO thin films had a direct band gap of 3.72, 2.98 and 2.43 eV, respectively. The ZnO films exhibited highest optical transmittance that varied between 70% - 88%. The film thickness of the samples was estimated from transmission spectra. The effective mass of the carriers (m*) at the Fermi level and the figure of merit of the deposited films are also investigated. Hall Effect measurements confirm the n-type nature of the TCO’s thin films. A low resistivity in the order of 10-2 (Ω.cm) has been observed for SnO2 and CdO thin films.
N. Amroun, M.; Salim, K.; H. Kacha, A.; and Khadraoui, M.
"Tco’s Thin Films Grown By Spray Pyrolysis Technique For Window Layer Of Solar Cell Application: A Comparative Study,"
International Journal of Thin Film Science and Technology: Vol. 9
, Article 3.
Available at: https://digitalcommons.aaru.edu.jo/ijtfst/vol9/iss2/3