Tin disulphide (SnS2) thin films has been prepared on glass substrates by chemical spray pyrolysis technique, using the precursor solutions of SnCl2.2H2O and thiourea with different molar concentration of 0.1 M – 0.4 M in steps of 0.1 M, at the substrate temperature of 548 K. The Structural properties have been determined by X-ray diffraction (XRD), and surface morphology have been observed on the surface of these films using Scanning Electron Microscope (SEM). The optical properties of the thin film deposited was obtained, using experimentally recorded absorption spectral data as functions of the wavelength in the range of 400– 800 nm at different molar concentrations. An analysis of the spectral absorption of the deposited film revealed optical direct and indirect band gap energy for SnS2 layer. A Fourier Transform Infrared Spectroscopy (FTIR) study confirms the presence of Sn–S bonds in SnS2 film in the molecular structure.
Gopalakrishnan, P.; Amalraj, L.; and Vijayakumar, K.
"Influence of Molar Concentration on Nano Tin Disulphide Thin Films Grown by Spray Pyrolysis Technique,"
International Journal of Thin Film Science and Technology: Vol. 9
, Article 10.
Available at: https://digitalcommons.aaru.edu.jo/ijtfst/vol9/iss3/10