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International Journal of Thin Film Science and Technology

International Journal of Thin Film Science and Technology

Abstract

The effect of 8% of (Ni2+, Ta5+) content and the route of synthesis (i.e., conventional solid state reaction « CSS » and molten salt method « MS ») on micro-structural, morphological and dielectric properties of BIT ceramics have been investigated. X-ray diffraction (XRD) analysis revealed that the (Ni,Ta)- modified BIT ceramics have a pure orthorhombic three-layer Aurivillius type structure. Phase purity is obtained at 950°C by CSS reaction and by the MS method at 850°C. SEM/ EDX results confirms that the samples have a relatively dense pure, with micro-grains plate-like, structure typical for Aurivillius layered structures but strongly influenced by the crystallite size of both methods. The dielectric constant and the tangent loss of 8%-BNTT have been found to be decreasing by shifting the curie temperature to a high temperature, when we change the reaction from CSS to MS.

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