The effect of 8% of (Ni2+, Ta5+) content and the route of synthesis (i.e., conventional solid state reaction « CSS » and molten salt method « MS ») on micro-structural, morphological and dielectric properties of BIT ceramics have been investigated. X-ray diffraction (XRD) analysis revealed that the (Ni,Ta)- modified BIT ceramics have a pure orthorhombic three-layer Aurivillius type structure. Phase purity is obtained at 950°C by CSS reaction and by the MS method at 850°C. SEM/ EDX results confirms that the samples have a relatively dense pure, with micro-grains plate-like, structure typical for Aurivillius layered structures but strongly influenced by the crystallite size of both methods. The dielectric constant and the tangent loss of 8%-BNTT have been found to be decreasing by shifting the curie temperature to a high temperature, when we change the reaction from CSS to MS.
Menasra, H.; Bounab, K.; Necira, Z.; Meklid, A.; and Boutarfaia, A.
"Effect of the Synthesis Route on the Structural, Morphological and Dielectric Properties of Bi4 (Ni2/3,Ta1/3)0.08Ti2.92O12 Aurivillius Phases,"
International Journal of Thin Film Science and Technology: Vol. 9
, Article 8.
Available at: https://digitalcommons.aaru.edu.jo/ijtfst/vol9/iss3/8