"Sequential Testing Procedure for the Parameter of Left Truncated Expon" by Mukesh Kumar, Aanchal Anant Awasthi et al.
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Journal of Statistics Applications & Probability

Author Country (or Countries)

India.

Abstract

In this paper, we have explored the sequential testing procedure for the left truncated exponential distribution (LTED). Also we have obtained the expressions of operating characteristic (OC) and average sample number (ASN) functions for left truncated exponential distribution.These results are presented through tables and graphs. The sequential probability ratio test (SPRT) is used for testing the hypothesis regarding parameter.

Digital Object Identifier (DOI)

http://dx.doi.org/10.18576/jsap/090111

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