Sequential Testing Procedure for the Parameter of Left Truncated Exponential Distribution

Authors

Mukesh Kumar, Department of Statistics, MMV, Banaras Hindu University, Varanasi-221005, India.Follow
Aanchal Anant Awasthi
Ajay Kumar
Kamalesh Kumar Patel

Author Country (or Countries)

India.

Abstract

In this paper, we have explored the sequential testing procedure for the left truncated exponential distribution (LTED). Also we have obtained the expressions of operating characteristic (OC) and average sample number (ASN) functions for left truncated exponential distribution.These results are presented through tables and graphs. The sequential probability ratio test (SPRT) is used for testing the hypothesis regarding parameter.

Digital Object Identifier (DOI)

http://dx.doi.org/10.18576/jsap/090111

Recommended Citation

Kumar, Mukesh; Anant Awasthi, Aanchal; Kumar, Ajay; and Kumar Patel, Kamalesh (2020) "Sequential Testing Procedure for the Parameter of Left Truncated Exponential Distribution," Journal of Statistics Applications & Probability: Vol. 9: Iss. 1, Article 11.
DOI: http://dx.doi.org/10.18576/jsap/090111
Available at: https://digitalcommons.aaru.edu.jo/jsap/vol9/iss1/11